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Feb 2013

Volume 81, Issue 2, pp. 85-159

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Two-frequency interferometer for a displacement measurement

Sin Hyuk Yim, D. Cho, and Jouyon Park

American Journal of Physics -- February 2013 -- Volume 81, Issue 2, pp. 153

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We report on the construction of a two-frequency Michelson interferometer to measure small displacements based on the heterodyne principle. Unlike the common single-frequency interferometer, where relative displacements produce changes in output power, in the two-frequency device, displacements lead to phase shifts of the beating signal. The short- and long-term performance of the single- and two-frequency methods are compared. The heterodyne apparatus was also used to calibrate a piezoelectric transducer.
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42.00.00 Optics
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